Glass comprising molybdenum and lead in a solar cell paste

ABSTRACT

In general, the invention relates to electro-conductive pastes comprising a glass which comprises molybdenum and lead as a constituent of a solar cell paste, and the use of such in the preparation of photovoltaic solar cells. More specifically, the invention relates to electroconductive pastes, precursors, processes for preparation of solar cells, solar cells and solar modules. 
     The invention relates to an electro-conductive paste at least comprising as paste constituents:
         a) metallic particles;   b) a glass;   c) an organic vehicle; and   d) an additive;   wherein the glass comprises the following:
           i) Pb in the range from about 1 to about 94 wt. %;   ii) Mo in the range from about 2 to about 30 wt. %;   iii) O in the range from about 1 to about 50 wt. %;   
           with the wt. % in each case being based on the total weight of the glass.

FIELD OF THE INVENTION

In general, the invention relates to electro-conductive pastes comprising a glass which comprises Molybdenum and Lead as a constituent of a solar cell paste, and the use of such in the preparation of photovoltaic solar cells. More specifically, the invention relates to electroconductive pastes, solar cell precursors, processes for preparation of solar cells, solar cells and solar modules.

BACKGROUND OF THE INVENTION

Solar cells are devices that convert the energy of light into electricity using the photovoltaic effect. Solar power is an attractive green energy source because it is sustainable and produces only non-polluting by-products. Accordingly, a great deal of research is currently being devoted to developing solar cells with enhanced efficiency while continuously lowering material and manufacturing costs. When light hits a solar cell, a fraction of the incident light is reflected by the surface and the remainder transmitted into the solar cell. The transmitted photons are absorbed by the solar cell, which is usually made of a semiconducting material, such as silicon which is often doped appropriately. The absorbed photon energy excites electrons of the semiconducting material, generating electron-hole pairs. These electron-hole pairs are then separated by p-n junctions and collected by conductive electrodes on the solar cell surfaces. FIG. 1 shows a minimal construction for a simple solar cell.

Solar cells are very commonly based on silicon, often in the form of a Si wafer. Here, a p-n junction is commonly prepared either by providing an n-type doped Si substrate and applying a p-type doped layer to one face or by providing a p-type doped Si substrate and applying an n-type doped layer to one face to give in both cases a so called p-n junction. The face with the applied layer of dopant generally acts as the front face of the cell, the opposite side of the Si with the original dopant acting as the back face. Both n-type and p-type solar cells are possible and have been exploited industrially. Cells designed to harness light incident on both faces are also possible, but their use has been less extensively harnessed.

In order to allow incident light on the front face of the solar cell to enter and be absorbed, the front electrode is commonly arranged in two sets of perpendicular lines known as “fingers” and “bus bars” respectively. The fingers form an electrical contact with the front face and bus bars link these fingers to allow charge to be drawn off effectively to the external circuit. It is common for this arrangement of fingers and bus bars to be applied in the form of an electroconductive paste which is fired to give solid electrode bodies. A back electrode is also often applied in the form of an electro-conductive paste which is then fired to give a solid electrode body. A typical electro-conductive paste contains metallic particles, glass, and an organic vehicle.

There has recently been increasing interest in n-type solar cells, wherein the front face is p-type doped. n-type solar cells have the potential for increased cell performance with respect to the analogous p-type cells, but disadvantages remain due to damage to the cell during firing resulting in a lowered efficiency.

There have been some attempts in the prior art to improve the properties of solar cells. One such attempt is described in EP2472526A2.

There is thus a need in the state of the art for improvements to the approach to producing solar cells.

SUMMARY OF THE INVENTION

The invention is generally based on the object of overcoming at least one of the problems encountered in the state of the art in relation to solar cells.

More specifically, the invention is further based on the object of provided a paste for the preparation of a solar cell with an improved cell efficiency.

A further object of the invention is to provide processes for preparing solar cells, a solar cell, and a solar cell module.

A contribution to achieving at least one of the above described objects is made by the subject matter of the category forming claims of the invention. A further contribution is made by the subject matter of the dependent claims of the invention which represent specific embodiments of the invention.

DETAILED DESCRIPTION

A contribution to achieving at least one of the above described objects is made by an electroconductive paste at least comprising as paste constituents:

-   -   a) metallic particles;     -   b) a glass;     -   c) an organic vehicle; and     -   d) an additive;     -   wherein the glass comprises the following:         -   i) Pb in the range from about 1 to about 96 wt. %,             preferably in the range from about 5 to about 70 wt. %, more             preferably in the range from about 10 to about 40 wt. %;         -   ii) Mo in the range from about 2 to about 30 wt. %,             preferably in the range from about 5 to about 20 wt. %, more             preferably in the range from about 6 to about 10 wt. %;         -   iii) O in the range from about 1 to about 50 wt. %,             preferably in the range from about 5 to about 40 wt. %, more             preferably in the range from about 10 to about 35 wt. %;     -   with the wt. % in each case being based on the total weight of         the glass.

In one embodiment of the paste, the Pb is present in the glass in oxidation state in a range from +2 to +4, preferably +2.

In one embodiment of the paste, the Mo is present in the glass in oxidation state in the range from +3 to +6, preferably +6.

In one embodiment of the paste, the glass comprises Te.

In one embodiment of the paste, the metallic particles are Ag particles.

In one embodiment of the paste, the glass is present in the paste in the range from about 1 wt. % to about 6 wt. %, based on the total weight of the paste.

A contribution to achieving at least one of the above mentioned objects is made by a precursor comprising the following:

-   -   a. a wafer;     -   b. an electro-conductive paste according to the invention         superimposed to over the wafer.

In one embodiment of the precursor, the wafer is an Si wafer.

In one embodiment of the precursor, the wafer comprises at least one n-doped region and at least one p-doped region.

In one embodiment of the precursor, the paste is superimposed over a p-doped region.

In one embodiment of the precursor, the paste is superimposed over an n-doped region.

In one embodiment of the precursor, the paste is superimposed over the front face of the wafer.

In one embodiment of the precursor, the paste is superimposed over the back face of the wafer.

A contribution to achieving at least one of the above mentioned objects is made by a process for the preparation of a solar cell at least comprising the steps:

-   -   i) provision of a solar cell precursor according to the         invention;     -   ii) firing of the solar cell precursor to obtain a solar cell.

A contribution to achieving at least one of the above mentioned objects is made by a solar cell obtainable by the process according to the invention.

A contribution to achieving at least one of the above mentioned objects is made by a solar cell comprising the following solar cell constituents:

-   -   a. A wafer;     -   b. An electrode, wherein the electrode contains Mo in the range         from about 0.01 to about 1.2 wt. %, based on the total weight of         the electrode.

A contribution to achieving at least one of the above mentioned objects is made by a module comprising at least one solar cell according to the invention and at least a further solar cell.

The above embodiments can be combined amongst each other. Each possible combination is herewith a part of the disclosure of the specification.

Wafers

Preferred wafers according to the invention are regions among other regions of the solar cell capable of absorbing light with high efficiency to yield electron-hole pairs and separating holes and electrons across a boundary with high efficiency, preferably across a so called p-n junction boundary. Preferred wafers according to the invention are those comprising a single body made up of a front doped layer and a back doped layer.

It is preferred for that wafer to consist of appropriately doped tetravalent elements, binary compounds, tertiary compounds or alloys. Preferred tetravalent elements in this context are Si, Ge or Sn, preferably Si. Preferred binary compounds are combinations of two or more tetravalent elements, binary compounds of a group III element with a group V element, binary compounds of a group II element with a group VI element or binary compounds of a group IV element with a group VI element. Preferred combinations of tetravalent elements are combinations of two or more elements selected from Si, Ge, Sn or C, preferably SiC. The preferred binary compounds of a group III element with a group V element is GaAs. It is most preferred according to the invention for the wafer to be based on Si. Si, as the most preferred material for the wafer, is referred to explicitly throughout the rest of this application. Sections of the following text in which Si is explicitly mentioned also apply for the other wafer compositions described above.

Where the front doped layer and back doped layer of the wafer meet is the p-n junction boundary. In an n-type solar cell, the back doped layer is doped with electron donating n-type dopant and the front doped layer is doped with electron accepting or hole donating p-type dopant. In a p-type solar cell, the back doped layer is doped with p-type dopant and the front doped layer is doped with n-type dopant. It is preferred according to the invention to prepare a wafer with a p-n junction boundary by first providing a doped Si substrate and then applying a doped layer to of the opposite type to one face of that substrate. In another embodiment of the invention the p-doped layer and a n-doped layer can be arranged at the same face of the wafer. This wafer design is often called interdigitated back contact as exemplified in Handbook of Photovoltaic Science and Engineering, 2^(nd) Edition, John Wiley & Sons, 2003, chapter 7.

Doped Si substrates are well known to the person skilled in the art. The doped Si substrate can be prepared in any way known to the person skilled in the art and which he considers to be suitable in the context of the invention. Preferred sources of Si substrates according to the invention are mono-crystalline Si, multi-crystalline Si, amorphous Si and upgraded metallurgical Si, mono-crystalline Si or multi-crystalline Si being most preferred. Doping to form the doped Si substrate can be carried out simultaneously by adding dopant during the preparation of the Si substrate or can be carried out in a subsequent step. Doping subsequent to the preparation of the Si substrate can be carried out for example by gas diffusion epitaxy. Doped Si substrates are also readily commercially available. According to the invention it is one option for the initial doping of the Si substrate to be carried out simultaneously to its formation by adding dopant to the Si mix. According to the invention it is one option for the application of the front doped layer and the highly doped back layer, if present, to be carried out by gas-phase epitaxy. This gas phase epitaxy is preferably carried out at a temperature in a range from about 500° C. to about 900° C., more preferably in a range from about 600° C. to about 800° C. and most preferably in a range from about 650° C. to about 750° C. at a pressure in a range from about 2 kPa to about 100 kPa, preferably in a range from about 10 to about 80 kPa, most preferably in a range from about 30 to about 70 kPa.

It is known to the person skilled in the art that Si substrates can exhibit a number of shapes, surface textures and sizes. The shape can be one of a number of different shapes including cuboid, disc, wafer and irregular polyhedron amongst others. The preferred shape according to the invention is wafer shaped where that wafer is a cuboid with two dimensions which are similar, preferably equal and a third dimension which is significantly less than the other two dimensions. Significantly less in this context is preferably at least a factor of about 100 smaller.

A variety of surface types are known to the person skilled in the art. According to the invention Si substrates with rough surfaces are preferred. One way to assess the roughness of the substrate is to evaluate the surface roughness parameter for a sub-surface of the substrate which is small in comparison to the total surface area of the substrate, preferably less than one hundredth of the total surface area, and which is essentially planar. The value of the surface roughness parameter is given by the ratio of the area of the subsurface to the area of a theoretical surface formed by projecting that subsurface onto the flat plane best fitted to the subsurface by minimising mean square displacement. A higher value of the surface roughness parameter indicates a rougher, more irregular surface and a lower value of the surface roughness parameter indicates a smoother, more even surface. According to the invention, the surface roughness of the Si substrate is preferably modified so as to produce an optimum balance between a number of factors including but not limited to light absorption and adhesion of fingers to the surface.

The two larger dimensions of the Si substrate can be varied to suit the application required of the resultant solar cell. It is preferred according to the invention for the thickness of the Si wafer to lie below about 0.5 mm more preferably below about 0.3 mm and most preferably below about 0.2 mm Some wafers have a minimum size of about 0.01 mm or more.

It is preferred according to the invention for the front doped layer to be thin in comparison to the back doped layer. In one embodiment of the invention, the front doped layer has a thickness in a range from about 10 nm to about 4 μm, preferably in a range from about 50 nm to about 1 μm and most preferably in a range from about 100 to about 800 nm.

The front doped layer is commonly thinner than the back doped layer. In one embodiment of the invention, the back doped layer has a greater thickness than the front doped layer.

A highly doped layer can be applied to the back face of the Si substrate between the back doped layer and any further layers. Such a highly doped layer is of the same doping type as the back doped layer and such a layer is commonly denoted with a+(n⁺-type layers are applied to n-type back doped layers and p⁺-type layers are applied to p-type back doped layers). This highly doped back layer serves to assist metallisation and improve electro-conductive properties at the substrate/electrode interface area. It is preferred according to the invention for the highly doped back layer, if present, to have a thickness in a range from about 10 nm to about 30 μm, preferably in a range from about 50 nm to about 20 μm and most preferably in a range from about 100 nm to about 10 μm.

Dopants

Preferred dopants are those which, when added to the Si wafer, form a p-n junction boundary by introducing electrons or holes into the band structure. It is preferred according to the invention that the identity and concentration of these dopants be specifically selected so as to tune the band structure profile of the p-n junction and set the light absorption and conductivity profiles as required. Preferred p-type dopants according to the invention are those which add holes to the Si wafer band structure. They are well known to the person skilled in the art. All dopants known to the person skilled in the art and which he considers to be suitable in the context of the invention can be employed as p-type dopant. Preferred p-type dopants according to the invention are trivalent elements, particularly those of group 13 of the periodic table. Preferred group 13 elements of the periodic table in this context include but are not limited to B, Al, Ga, In, Tl or a combination of at least two thereof, wherein B is particularly preferred. In one embodiment of the invention, the p-doped layer comprises B as a dopant.

Preferred n-type dopants according to the invention are those which add electrons to the Si wafer band structure. They are well known to the person skilled in the art. All dopants known to the person skilled in the art and which he considers to be suitable in the context of the invention can be employed as n-type dopant. Preferred n-type dopants according to the invention are elements of group 15 of the periodic table. Preferred group 15 elements of the periodic table in this context include N, P, As, Sb, Bi or a combination of at least two thereof, wherein P is particularly preferred. In one embodiment of the invention, the n-doped layer comprises P as dopant.

As described above, the various doping levels of the p-n junction can be varied so as to tune the desired properties of the resulting solar cell.

According to the invention, it is preferred for the back doped layer to be lightly doped, preferably with a dopant concentration in a range from about 1×10¹³ to about 1×10¹⁸ cm³, preferably in a range from about 1×10¹⁴ to about 1×10¹⁷ cm³, most preferably in a range from about 5×10¹⁵ to about 5×10¹⁶ cm³. Some commercial products have a back doped layer with a dopant concentration of about 1×10¹⁶.

In one embodiment of the invention, the highly doped back layer (if one is present) is highly doped, preferably with a concentration in a range from about 1×10¹⁷ to about 5×10²¹ cm³, more preferably in a range from about 5×10¹⁷ to about 5×10²⁰ cm³, and most preferably in a range from about 1×10¹⁸ to about 1×10²⁰ cm³.

Electro-Conductive Paste

Preferred electro-conductive pastes according to the invention are pastes which can be applied to a surface and which, on firing, form solid electrode bodies in electrical contact with that surface. The constituents of the paste and proportions thereof can be selected by the person skilled in the art in order that the paste have the desired properties such as sintering and printability and that the resulting electrode have the desired electrical and physical properties. Metallic particles can be present in the paste, primarily in order that the resulting electrode body be electrically conductive. In order to bring about appropriate sintering through surface layers and into the Si wafer, a glass can be employed. An example composition of an electrically-conductive paste which is preferred in the context of the invention might comprise:

-   -   i) Metallic particles, preferably silver particles, preferably         at least about 50 wt. %, more preferably at least about 70 wt. %         and most preferably at least about 80 wt. %;     -   ii) A glass, preferably a glass frit, preferably in a range from         about 0.1 to about 6 wt. %, more preferably in a range from         about 0.5 to about 5 wt. % and most preferably in a range from         about 1 to about 4 wt. %,         -   wherein the glass comprises the following:             -   i) Pb in the range from about 1 to about 96 wt. %,                 preferably in the range from about 5 to about 70 wt. %,                 more preferably in the range from about 10 to about 40                 wt. %;             -   ii) Mo in the range from about 2 to about 30 wt. %,                 preferably in the range from about 5 to about 20 wt. %,                 more preferably in the range from about 6 to about 10                 wt. %;             -   iii) O in the range from about 1 to about 50 wt. %,                 preferably in the range from about 5 to about 40 wt. %,                 more preferably in the range from about 10 to about 35                 wt. %;         -   with the wt. % in each case being based on the total weight             of the glass;     -   iii) Organic vehicle, preferably in a range from about 5 to         about 40 wt. %, more preferably in a range from about 5 to about         30 wt. % and most preferably in a range from about 5 to about 15         wt. %;     -   iv) An additive, preferably in a range from about 0 to about 15         wt. %, more preferably in a range from about 0 to about 10 wt. %         and most preferably in a range from about 0.3 to about 5 wt. %.     -   wherein the wt. % are each based on the total weight of the         electro-conductive paste and add up to 100 wt. %.

In order to facilitate printability of the electro-conductive paste, it is preferred according to the invention for the electro-conductive paste to have a viscosity and thixotropic index which facilitate printability. In one embodiment of the invention, the electro-conductive paste satisfies at least one of the following criteria:

-   -   viscosity in a range from about 5 to about 35 Pas, preferably in         a range from about 10 to about 25 Pas and most preferably in a         range from about 15 to about 20 Pas.     -   all solvents present in the paste have a boiling point in a         range from about 90 to about 300° C.

Organic Vehicle

Preferred organic vehicles in the context of the invention are solutions, emulsions or dispersions based on one or more solvents, preferably an organic solvent, which ensure that the constituents of the electro-conductive paste are present in a dissolved, emulsified, or dispersed to form. Preferred organic vehicles are those which provide optimal stability of constituents within the electro-conductive paste and endow the electro-conductive paste with a viscosity allowing effective line printability. Preferred organic vehicles according to the invention comprise as vehicle components:

-   -   (i) a binder, preferably in a range from about 1 to about 10 wt.         %, more preferably in a range from about 2 to about 8 wt. % and         most preferably in a range from about 3 to about 7 wt. %;     -   (ii) a surfactant, preferably in a range from about 0 to about         10 wt. %, more preferably in a range from about 0 to about 8 wt.         % and most preferably in a range from about 0.01 to about 6 wt.         %;     -   (ii) one or more solvents, the proportion of which is determined         by the proportions of the other constituents in the organic         vehicle;     -   (iv) optional additives, preferably in range from about 0 to         about 10 wt. %, more preferably in a range from about 0 to about         8 wt. % and most preferably in a range from about 1 to about 5         wt. %,         wherein the wt. % are each based on the total weight of the         organic vehicle and add up to 100 wt. %. According to the         invention preferred organic vehicles are those which allow for         the preferred high level of printability of the         electro-conductive paste described above to be achieved.

Metallic Particles

Silver is a preferred metal particle according to the invention. Preferred metallic particles in the context of the invention are those which exhibit metallic conductivity or which yield a substance which exhibits metallic conductivity on firing. Metallic particles present in the electroconductive paste give metallic conductivity to the solid electrode which is formed when the electro-conductive paste is sintered on firing. Metallic particles which favour effective sintering and yield electrodes with high conductivity and low contact resistance are preferred. Metallic particles are well known to the person skilled in the art. All metallic particles known to to the person skilled in the art and which he considers suitable in the context of the invention can be employed as the metallic particles in the electro-conductive paste. Preferred metallic particles according to the invention are metals, alloys, mixtures of at least two metals, mixtures of at least two alloys or mixtures of at least one metal with at least one alloy.

Preferred metals which can be employed as metallic particles, in the same manner as silver, preferably in addition to silver, according to the invention, are Au, Cu, Al, Zn, Pd, Ni, Pb and mixtures of at least two thereof, preferably Au or Al. Preferred alloys which can be employed as metallic particles according to the invention are alloys containing at least one metal selected from the list of Ag, Cu, Al, Zn, Ni, W, Pb, and Pd or mixtures or two or more of those alloys.

In one embodiment of the invention, the metallic particles comprise a metal or alloy coated with one or more further different metals or alloys, for example copper coated with silver.

As additional constituents of the metallic particles, further to above mentioned constituents, those constituents which contribute to more favourable sintering properties, electrical contact, adhesion and electrical conductivity of the formed electrodes are preferred according to the invention. All additional constituents known to the person skilled in the art and which he considers to be suitable in the context of the invention can be employed in the metallic particles. Those additional substituents which represent complementary dopants for the face to which the electro-conductive paste is to be applied are preferred according to the invention. When forming an electrode interfacing with an n-type doped Si layer, additives capable of acting as n-type dopants in Si are preferred. Preferred n-type dopants in this context are group 15 elements or compounds which yield such elements on firing. Preferred group 15 elements in this context according to the invention are P and Bi. When forming an electrode interfacing with a p-type doped Si layer, additives capable of acting as p-type dopants in Si are preferred. Preferred p-type dopants are group 13 elements or compounds which yield such elements on firing. Preferred group 13 elements in this context according to the invention are B and Al.

It is well known to the person skilled in the art that metallic particles can exhibit a variety of shapes, surfaces, sizes, surface area to volume ratios, oxygen content and oxide layers. A large number of shapes are known to the person skilled in the art. Some examples are spherical, angular, elongated (rod or needle like) and flat (sheet like). Metallic particles may also be present to as a combination of particles of different shapes. Metallic particles with a shape, or combination of shapes, which favours advantageous sintering, electrical contact, adhesion and electrical conductivity of the produced electrode are preferred according to the invention. One way to characterise such shapes without considering surface nature is through the parameters length, width and thickness. In the context of the invention the length of a particle is given by the length of the longest spatial displacement vector, both endpoints of which are contained within the particle. The width of a particle is given by the length of the longest spatial displacement vector perpendicular to the length vector defined above both endpoints of which are contained within the particle. The thickness of a particle is given by the length of the longest spatial displacement vector perpendicular to both the length vector and the width vector, both defined above, both endpoints of which are contained within the particle. In one embodiment according to the invention, metallic particles with as uniform a shape as possible are preferred i.e. shapes in which the ratios relating the length, the width and the thickness are as close as possible to 1, preferably all ratios lying in a range from about 0.7 to about 1.5, more preferably in a range from about 0.8 to about 1.3 and most preferably in a range from about 0.9 to about 1.2. Examples of preferred shapes for the metallic particles in this embodiment are therefore spheres and cubes, or combinations thereof, or combinations of one or more thereof with other shapes. In one embodiment of the invention, the Ag particles in the electro-conductive paste are spherical. In another embodiment according to the invention, metallic particles are preferred which have a shape of low uniformity, preferably with at least one of the ratios relating the dimensions of length, width and thickness being above about 1.5, more preferably above about 3 and most preferably above about 5. Preferred shapes according to this embodiment are flake shaped, rod or needle shaped, or a combination of flake shaped, rod or needle shaped with other shapes.

A variety of surface types are known to the person skilled in the art. Surface types which favour effective sintering and yield advantageous electrical contact and conductivity of produced electrodes are favoured for the surface type of the metallic particles according to the invention.

The particle diameter d₅₀ and the associated values d₁₀ and d₉₀ are characteristics of particles well known to the person skilled in the art. It is preferred according to the invention that the average particle diameter d₅₀ of the metallic particles lie in a range from about 0.5 to about 10 μm, more preferably in a range from about 1 to about 10 μm and most preferably in a range to from about 1 to about 5 μm. The determination of the particle diameter d₅₀ is well known to a person skilled in the art.

In one embodiment of the invention, the silver particles have a d₅₀ in a range from about 1 to about 4 μm, preferably in a range from about 2 to about 3.5 μm, more preferably in a range from about 2.8 to about 3.2 μm.

In another embodiment of the invention, the aluminium particles have a d₅₀ in a range from about 1 to about 5 μm, preferably in a range from about 2 to about 4 μm, more preferably in a range from about 2.5 to about 3.5 μm.

The metallic particles may be present with a surface coating. Any such coating known to the person skilled in the art and which he considers to be suitable in the context of the invention can be employed on the metallic particles. Preferred coatings according to the invention are those coatings which promote improved printing, sintering and etching characteristics of the electro-conductive paste. If such a coating is present, it is preferred according to the invention for that coating to correspond to no more than about 10 wt. %, preferably no more than about 8 wt. %, most preferably no more than about 5 wt. %, in each case based on the total weight of the metallic particles.

In one embodiment according to the invention, the silver particles, are present as a proportion of the electro-conductive paste more than about 50 wt. %, preferably more than about 70 wt. %, most preferably more than about 80 wt. %.

Glass

Glass, preferably glass frit, is present in the electro-conductive paste according to the invention in order to bring about etching and sintering. Effective etching is required to etch through any additional layers which may have been applied to the Si wafer and thus lie between the front doped layer and the applied electro-conductive paste as well as to etch into the Si wafer to an appropriate extent. Appropriate etching of the Si wafer means deep enough to bring about good electrical contact between the electrode and the front doped layer and thus lead to a low contact resistance but not so deep as to interfere with the p-n junction boundary. Preferred, to glasses, preferably glass frits, in the context of the invention are powders of amorphous or partially crystalline solids which exhibit a glass transition. The glass transition temperature T_(g) is the temperature at which an amorphous substance transforms from a rigid solid to a partially mobile undercooled melt upon heating. Methods for the determination of the glass transition temperature are well known to the person skilled in the art. The etching and sintering brought about by the glass, preferably the glass frit, occurs above the glass transition temperature of the glass, preferably the glass frit, and it is preferred that the glass transition temperature lie below the desired peak firing temperature. Glasses, preferably glass frits, are well known to the person skilled in the art. All glasses, preferably glass frits, known to the person skilled in the art and which he considers suitable in the context of the invention can be employed as the glass in the electro-conductive paste.

In the context of the invention, the glass, preferably the glass frit, present in the electroconductive paste preferably comprises elements, oxides, compounds which generate oxides on heating, other compounds, or mixtures thereof. It is preferred in the context of the present invention for the glass to comprise the following glass constituents:

-   -   i) Pb in the range from about 1 to about 96 wt. %, preferably in         the range from about 5 to about 70 wt. %, more preferably in the         range from about 10 to about 40 wt. %;     -   ii) Mo in the range from about 2 to about 30 wt. %, preferably         in the range from about 5 to about 20 wt. %, more preferably in         the range from about 6 to about 10 wt. %;     -   iii) O in the range from about 1 to about 50 wt. %, preferably         in the range from about 5 to about 40 wt. %, more preferably in         the range from about 10 to about 35 wt. %;     -   with the wt. % in each case being based on the total weight of         the glass.

In one embodiment of the invention, it is preferred for the glass to comprise Te, preferably in the range from about 1 to about 20 wt. %, more preferably in the range from about 2 to about 15 wt. %, most preferably in the range from about 3 to about 10 wt. %, based on the total weight of the glass.

The above elements are preferably present in the glass as a result of including oxide constituents in the precursor materials to the glass. The Mo in the glass is preferably the result of one or more tungsten oxides, preferably MoO₃, being included in the precursor mixture. The Pb in the glass is preferably the result of one or more lead oxides, preferably PbO and/or PbO₂, being included in the precursor mixture. The Te in the glass is preferably the result of one or more tellurium oxides, preferably TeO and/or TeO₂ and/or TeO₃, being present in the precursor mixture. The O is preferably present in the glass as a result of one or more of MoO₃, PbO, PbO₂, TeO, TeO₂, TeO₃, or other oxides being present in the precursor mixture.

In addition, preferred elements in the glass are Si, B, Al, Bi, Li, Na, Mg, Zn, Gd, Ce, Zr, Ti, Mn, Sn, Ru, Co, Fe, Cu, Ba and Cr or mixtures of two or more from this list. Preferred oxides which can be comprised by the glass, preferably the glass frit, in the context of the invention are alkali metal oxides, alkali earth metal oxides, rare earth oxides, group V and group VI oxides, other oxides, or combinations thereof. Preferred alkali metal oxides in this context are sodium oxide, lithium oxide, potassium oxide, rubidium oxides, caesium oxides or combinations thereof. Preferred alkali earth metal oxides in this context are beryllium oxide, magnesium oxide, calcium oxide, strontium oxide, barium oxide, or combinations thereof. Preferred group V oxides in this context are phosphorous oxides, such as P₂O₅, bismuth oxides, such as Bi₂O₃, or combinations thereof. Preferred group VI oxides in this context are selenium oxides, such as SeO₂. Preferred rare earth oxides are cerium oxide, such as CeO₂ and lanthanum oxides, such as La₂O₃. Other preferred oxides in this context are silicon oxides, such as SiO₂, zinc oxides, such as ZnO, aluminium oxides, such as Al₂O₃, germanium oxides, such as GeO₂, vanadium oxides, such as V₂O₅, niobium oxides, such as Nb₂O₅, boron oxide, tungsten oxides, such as WO₃, and indium oxides, such as In₂O₃, further oxides of those elements listed above as preferred elements, or combinations thereof. Preferred oxides are also mixed oxides containing at least two of the elements listed as preferred elemental constituents of the glass, preferably the frit glass, or mixed oxides which are formed by heating at least one of the above named oxides with at least one of the above named metals. Mixtures of at least two of the above-listed oxides and mixed oxides are also preferred in the context of the invention.

As mentioned above, it is preferred for the glass, preferably the glass frit, to have a glass transition temperature below the desired firing temperature of the electro-conductive paste. In one embodiment of the invention the glass, preferably the glass frit, has a glass transition temperature in the range from about 250 to about 530° C., more preferably in a range from about 300 to about 500° C., and most preferably in a range from about 320 to about 450° C.

It is well known to the person skilled in the art that glass particles can exhibit a variety of shapes, surface natures, sizes, surface area to volume ratios, and coating layers.

A large number of shapes of glass particles are known to the person skilled in the art. Some examples are spherical, angular, elongated (rod or needle like) and flat (sheet like). Glass particles may also be present as a combination of particles of different shapes. Glass particles with a shape, or combination of shapes, which favours advantageous sintering, adhesion, electrical contact and electrical conductivity of the produced electrode are preferred according to the invention.

The average particles diameter d₅₀, and the associated parameters d₁₀ and d₉₀ are characteristics of particles well known to the person skilled in the art. It is preferred according to the invention that the average particle diameter d₅₀ of the glass lies in a range from about 0.1 to about 10 μm, more preferably in a range from about 0.2 to about 7 μm and most preferably in a range from about 0.5 to about 5 μm.

In one embodiment of the invention, the glass particles have a d₅₀ in a range from about 0.1 to about 3 μm, preferably in a range from about 0.5 to about 2 μm, more preferably in a range from about 0.8 to about 1.5 μm.

Binder

Preferred binders in the context of the invention are those which contribute to the formation of an electro-conductive paste with favourable stability, printability, viscosity, sintering and etching properties. Binders are well known to the person skilled in the art. All binders which are known to the person skilled in the art and which he considers to be suitable in the context of this invention can be employed as the binder in the organic vehicle. Preferred binders according to the invention (which often fall within the category termed “resins”) are polymeric binders, monomeric binders, and binders which are a combination of polymers and monomers. Polymeric binders can also be copolymers wherein at least two different monomeric units are contained in a single molecule. Preferred polymeric binders are those which carry functional groups in the polymer main chain, those which carry functional groups off of the main chain and those which carry functional groups both within the main chain and off of the main chain. Preferred polymers carrying functional groups in the main chain are for example polyesters, substituted polyesters, polycarbonates, substituted polycarbonates, polymers which carry cyclic groups in the main chain, poly-sugars, substituted poly-sugars, polyurethanes, substituted polyurethanes, polyamides, substituted polyamides, phenolic resins, substituted phenolic resins, copolymers of the monomers of one or more of the preceding polymers, optionally with other co-monomers, or a combination of at least two thereof. Preferred polymers which carry cyclic groups in the main chain are polyvinylbutylate (PVB) and its derivatives and polyterpineol and its derivatives or mixtures thereof. Other preferred polymers are cellulose ester resins e.g. selected from the group consisting of cellulose acetate propionate, cellulose acetate butyrate, and mixtures thereof, preferably those disclosed in US 2013 180583 which is herewith incorporated by reference. Preferred poly-sugars are for example cellulose and alkyl derivatives thereof, preferably methyl cellulose, ethyl cellulose, propyl cellulose, butyl cellulose and their derivatives and mixtures of at least two thereof. Preferred polymers which carry functional groups off of the main polymer chain are those which carry amide groups, those which carry acid and/or ester groups, often called acrylic resins, or polymers which carry a combination of aforementioned functional groups, or a combination thereof. Preferred polymers which carry amide off of the main chain are for example polyvinyl pyrrolidone (PVP) and its derivatives. Preferred polymers which carry acid and/or ester groups off of the main chain are for example polyacrylic acid and its derivatives, polymethacrylate (PMA) and its derivatives or polymethylmethacrylate (PMMA) and its derivatives, or a mixture thereof. Preferred monomeric binders according to the invention are ethylene glycol based monomers, terpineol resins or rosin derivatives, or a mixture thereof. Preferred monomeric binders based on ethylene glycol are those with ether groups, ester groups or those with an ether group and an ester group, preferred ether groups being methyl, ethyl, propyl, butyl, pentyl hexyl and higher alkyl ethers, the preferred ester group being acetate and its alkyl derivatives, preferably ethylene glycol monobutylether monoacetate or a mixture thereof. Alkyl cellulose, preferably ethyl cellulose, its derivatives and mixtures thereof with other binders from the preceding lists of binders or otherwise are the most preferred binders in the context of the invention.

Surfactant

Preferred surfactants in the context of the invention are those which contribute to the formation of an electro-conductive paste with favourable stability, printability, viscosity, sintering and etching properties. Surfactants are well known to the person skilled in the art. All surfactants which are known to the person skilled in the art and which he considers to be suitable in the context of this invention can be employed as the surfactant in the organic vehicle. Preferred surfactants in the context of the invention are those based on linear chains, branched chains, aromatic chains, fluorinated chains, siloxane chains, polyether chains and combinations thereof. Preferred surfactants are single chained double chained or poly chained. Preferred surfactants according to the invention have non-ionic, anionic, cationic, or zwitterionic heads.

Preferred surfactants are polymeric and monomeric or a mixture thereof. Preferred surfactants according to the invention can have pigment affinic groups, preferably hydroxyfunctional carboxylic acid esters with pigment affinic groups (e.g., DISPERBYK® 408, manufactured by BYK USA, Inc.), acrylate copolymers with pigment affinic groups (e.g., DISPERBYK® 416, manufactured by BYK USA, Inc.), modified polyethers with pigment affinic groups (e.g., TEGO® DISPERS 655, manufactured by Evonik Tego Chemie GmbH), other surfactants with groups of high pigment affinity (e.g., TEGO® DISPERS 662 C, manufactured by Evonik Tego Chemie GmbH). Other preferred polymers according to the invention not in the above list are polyethyleneglycol and its derivatives, and alkyl carboxylic acids and their derivatives or salts, or mixtures thereof. The preferred polyethyleneglycol derivative according to the invention is poly(ethyleneglycol)acetic acid. Preferred alkyl carboxylic acids are those with fully saturated and those with singly or poly unsaturated alkyl chains or mixtures thereof. Preferred carboxylic acids with saturated alkyl chains are those with alkyl chains lengths in a range from about 8 to about 20 carbon atoms, preferably C₉H₁₉COOH (capric acid), C₁₁H₂₃COOH (Lauric acid), C₁₃H₂₇COOH (myristic acid) C₁₅H₃₁COOH (palmitic acid), C₁₇H₃₅COOH (stearic acid) or mixtures thereof. Preferred carboxylic acids with unsaturated alkyl chains are C₁₈H₃₄O₂ (oleic acid) and C₁₈H₃₂O₂ (linoleic acid). The preferred monomeric surfactant according to the invention is benzotriazole and its derivatives.

Solvent

Preferred solvents according to the invention are constituents of the electro-conductive paste which are removed from the paste to a significant extent during firing, preferably those which are present after firing with an absolute weight reduced by at least about 80% compared to before firing, preferably reduced by at least about 95% compared to before firing. Preferred solvents according to the invention are those which allow an electro-conductive paste to be formed which has favourable viscosity, printability, stability and sintering characteristics and which yields electrodes with favourable electrical conductivity and electrical contact to the substrate. Solvents are well known to the person skilled in the art. All solvents which are known to the person skilled in the art and which he considers to be suitable in the context of this invention can be employed as the solvent in the organic vehicle. According to the invention preferred solvents are those which allow the preferred high level of printability of the electro-conductive paste as described above to be achieved. Preferred solvents according to the invention are those which exist as a liquid under standard ambient temperature and pressure (SATP) (298.15 K, 100 kPa), preferably those with a boiling point above about 90° C. and a melting point above about −20° C. Preferred solvents according to the invention are polar or non-polar, protic or aprotic, aromatic or non-aromatic. Preferred solvents according to the invention are mono-alcohols, di-alcohols, poly-alcohols, mono-esters, di-esters, poly-esters, mono-ethers, di-ethers, poly-ethers, solvents which comprise at least one or more of these categories of functional group, optionally comprising other categories of functional group, preferably cyclic groups, aromatic groups, unsaturated-bonds, alcohol groups with one or more O atoms replaced by heteroatoms, ether groups with one or more O atoms replaced by heteroatoms, esters groups with one or more O atoms replaced by heteroatoms, and mixtures of two or more of the aforementioned solvents. Preferred esters in this context are di-alkyl esters of adipic acid, preferred alkyl constituents being methyl, ethyl, propyl, butyl, pentyl, hexyl and higher alkyl groups or combinations of two different such alkyl groups, preferably dimethyladipate, and mixtures of two or more adipate esters. Preferred ethers in this context are diethers, preferably dialkyl ethers of ethylene glycol, preferred alkyl constituents being methyl, ethyl, propyl, butyl, pentyl, hexyl and higher alkyl groups or combinations of two different such alkyl groups, and mixtures of two diethers. Preferred alcohols in this context are primary, secondary and tertiary alcohols, preferably tertiary alcohols, terpineol and its derivatives being preferred, or a mixture of two or more alcohols. Preferred solvents which combine more than one different functional groups are 2,2,4-trimethyl-1,3-pentanediol monoisobutyrate, often called texanol, and its derivatives, 2-(2-ethoxyethoxyl)ethanol, often known as carbitol, its alkyl derivatives, preferably methyl, ethyl, propyl, butyl, pentyl, and hexyl carbitol, preferably to hexyl carbitol or butyl carbitol, and acetate derivatives thereof, preferably butyl carbitol acetate, or mixtures of at least 2 of the aforementioned.

Additives in the Organic Vehicle

Preferred additives in the organic vehicle are those additives which are distinct from the aforementioned vehicle components and which contribute to favourable properties of the electro-conductive paste, such as advantageous viscosity, sintering, electrical conductivity of the produced electrode and good electrical contact with substrates. All additives known to the person skilled in the art and which he considers to be suitable in the context of the invention can be employed as additive in the organic vehicle. Preferred additives according to the invention are thixotropic agents, viscosity regulators, stabilising agents, inorganic additives, thickeners, emulsifiers, dispersants or pH regulators. Preferred thixotropic agents in this context are carboxylic acid derivatives, preferably fatty acid derivatives or combinations thereof. Preferred fatty acid derivatives are C₉H₁₉COOH (capric acid), C₁₁H₂₃COOH (Lauric acid), C₁₃H₂₇COOH (myristic acid) C₁₅H₃₁COOH (palmitic acid), C₁₇H₃₅COOH (stearic acid) C₁₈H₃₄O₂ (oleic acid), C₁₈H₃₂O₂ (linoleic acid) or combinations thereof. A preferred combination comprising fatty acids in this context is castor oil.

Additives in the Electro-Conductive Paste

Preferred additives in the context of the invention are constituents added to the electroconductive paste, in addition to the other constituents explicitly mentioned, which contribute to increased performance of the electro-conductive paste, of the electrodes produced thereof or of the resulting solar cell. All additives known to the person skilled in the art and which he considers suitable in the context of the invention can be employed as additive in the electroconductive paste. In addition to additives present in the vehicle, additives can also be present in the electro-conductive paste. Preferred additives according to the invention are thixotropic agents, viscosity regulators, emulsifiers, stabilising agents or pH regulators, inorganic additives, thickeners and dispersants or a combination of at least two thereof, whereas inorganic additives are most preferred. Preferred inorganic additives in this context according to the invention are Mg, Ni, Te, W, Zn, Mg, Gd, Ce, Zr, Ti, Mn, Sn, Ru, Co, Fe, Cu and Cr or a combination of at least two thereof, preferably Zn, Sb, Mn, Ni, W, Te and Ru or a combination of to at least two thereof, oxides thereof, compounds which can generate those metal oxides on firing, or a mixture of at least two of the aforementioned metals, a mixture of at least two of the aforementioned oxides, a mixture of at least two of the aforementioned compounds which can generate those metal oxides on firing, or mixtures of two or more of any of the above mentioned.

Solar Cell Precursor

A contribution towards achieving at least one of the above mentioned objects is made by a solar cell precursor comprising the following solar cell precursor constituents:

-   -   a. A wafer, preferably a Si wafer;     -   b. A paste according to the invention, superimposed on the         wafer.

In one embodiment, one or more further pastes are superimposed on the wafer.

Preferred solar cell precursors are those which furnish n-type solar cells on firing, preferably those in which the electro-conductive paste of the invention forms a front side electrode on firing.

In one embodiment of the solar cell precursor according to the invention, the paste is superimposed over the p-doped layer.

In one embodiment of the solar cell precursor according to the invention, the paste is superimposed over the thinner of the two doped layers.

Process for Producing a Solar Cell

A contribution to achieving at least one of the aforementioned objects is made by a process for producing a solar cell at least comprising the following as process steps:

-   -   i) provision of a solar cell precursor as described above, in         particular combining any of the above described embodiments; and     -   ii) firing of the solar cell precursor to obtain a solar cell.

Printing

It is preferred according to the invention that the front and back electrodes are applied by applying an electro-conductive paste and then firing said electro-conductive paste to obtain a sintered body. The electro-conductive paste can be applied in any manner known to the person skilled in that art and which he considers suitable in the context of the invention including but not limited to impregnation, dipping, pouring, dripping on, injection, spraying, knife coating, curtain coating, brushing or printing or a combination of at least two thereof, wherein preferred printing techniques are ink-jet printing, screen printing, tampon printing, offset printing, relief printing or stencil printing or a combination of at least two thereof. It is preferred according to the invention that the electro-conductive paste is applied by printing, preferably by screen printing. In one embodiment of the invention, the electro-conductive paste is applied to the front face through a screen. In one aspect of this embodiment the application through a screen satisfies at least one of the following parameters:

-   -   mesh count in a range from about 290 to about 400, preferably in         a range from about 310 to about 390, more preferably in a range         from about 330 to about 370;     -   wire thickness in a range from about 10 to about 30 μm,         preferably in a range from about 12 to about 25 μm, more         preferably in a range from about 15 to about 23 μm;     -   Emulsion over mesh (EoM) thickness in a range from about 5 to         about 25 μm, preferably in a range from about 10 to about 20 μm,         more preferably in a range from about 13 to about 18 μm     -   finger spacing in a range from about 1 to about 3 mm, preferably         in a range from about 1.8 to about 2.5 mm, more preferably in a         range from about 2 to about 2.3 mm.

In one embodiment of the invention, the electro-conductive paste is superimposed on the first area on the front face in a grid pattern. In one aspect of this embodiment, this grid pattern comprises fingers with a width in a range from about 20 to about 100 μm, preferably in a range from about 30 to about 80 μm, more preferably in a range from about 30 to about 60 μm and bus bars at an angle thereto in a range from about 70 to about 90°, these bus bars having a width in a range from about 0.5 to about 2.5 mm, preferably in a range from about 1 to about 2 mm, more preferably in a range from about 1.3 to about 1.8 mm

In a further embodiment of the invention, an electro-conductive paste is superimposed on the further area on the back face in a grid pattern. In one aspect of this embodiment, this grid pattern comprises fingers with a width in a range from about 20 to about 180 μm, preferably in a range from about 30 to about 100 μm, more preferably in a range from about 40 to about 60 μm and bus bars at an angle thereto in a range from about 70 to about 90°, these bus bars having a width in a range from about 0.5 to about 2.5 mm, preferably in a range from about 1 to about 2 mm, more preferably in a range from about 1.3 to about 1.8 mm.

Firing

It is preferred according to the invention for electrodes to be formed by first applying an electro-conductive paste and then firing said electro-conductive paste to yield a solid electrode body. Firing is well known to the person skilled in the art and can be carried out in any manner known to him and which he considers suitable in the context of the invention. Firing must be carried out above the glass transition temperature of at least one glass, preferably of two or more glasses and more preferably all glasses present in the paste.

In one embodiment of the invention, the firing stage satisfies at least one of the following criteria:

-   -   holding temperature measured according to the method titled         “temperature profile in the firing furnace” given below, in a         range from about 700 to about 900° C., preferably in a range         from about 730 to about 880° C.;     -   time at the holding temperature in a range from about 1 to about         10 s.

It is preferred according to the invention for firing to be carried out with a holding time in a range from about 10 s to about 2 minutes, more preferably in a range from about 25 s to about 90 s and most preferably in a range from about 40 s to about 1 minute.

Firing of electro-conductive pastes on the front and back faces can be carried out simultaneously or sequentially. Simultaneous firing is appropriate if the electro-conductive pastes applied to both faces have similar, preferably identical, optimum firing conditions. Where appropriate, it is preferred according to the invention for firing to be carried out simultaneously. Where firing is effected sequentially, it is preferable according to the invention for the back electro-conductive paste to be applied and fired first, followed by application and firing of the electro-conductive paste to the front face.

Solar Cell

A contribution to achieving at least one of the above described objects is made by a solar cell obtainable by a process according to the invention. Preferred solar cells according to the invention are those which have a high efficiency in terms of proportion of total energy of incident light converted into electrical energy output and which are light and durable, preferably an ntype solar cell. As exemplified in FIG. 2, one layer configuration for the solar cell is as follows: (i) Front electrode, (ii) Anti reflection coating, (iii) Front passivation layer, (iv) Front doped layer, (v) p-n junction boundary, (vi) Back doped layer, (vii) Highly doped back layer, (viii) Back passivation layer, (ix) Back electrode. Individual layers can be omitted from this common layer configuration or individual layers can indeed perform the function of more than one of the layers described in the common embodiment outlined above. In one embodiment of the invention, a single layer acts as both anti-reflection layer and passivation layer. As exemplified in FIG. 1, another layer configuration is as follows: (I) Front electrode, (II) Front doped layer, (III) p-n junction boundary, (IV) Back doped layer, (V) Back electrode.

Anti-Reflection Coating

According to the invention, an anti-reflection coating can be applied as the outer and often as the outermost layer before the electrode on the front face of the solar cell. Preferred anti-reflection coatings according to the invention are those which decrease the proportion of incident light reflected by the front face and increase the proportion of incident light crossing the front face to be absorbed by the wafer. Anti-reflection coatings which give rise to a favourable absorption/reflection ratio, are susceptible to etching by the employed electro-conductive paste but are otherwise resistant to the temperatures required for firing of the electro-conductive paste, and do not contribute to increased recombination of electrons and holes in the vicinity of the electrode interface are favoured. All anti-reflection coatings known to the person skilled in the art and which he considers to be suitable in the context of the invention can be employed. Preferred anti-reflection coatings according to the invention are SiN_(x), SiO₂, Al₂O₃, TiO₂ or mixtures of at least two thereof and/or combinations of at least two layers thereof, wherein to SiN_(x) is particularly preferred, in particular where an Si wafer is employed.

The thickness of anti-reflection coatings is suited to the wavelength of the appropriate light. According to the invention it is preferred for anti-reflection coatings to have a thickness in a range from about 20 to about 300 nm, more preferably in a range from about 40 to about 200 nm and most preferably in a range from about 60 to about 90 nm.

Passivation Layers

According to the invention, one or more passivation layers can be applied to the front and/or back side as outer or as the outermost layer before the electrode, or before the anti-reflection layer if one is present. Preferred passivation layers are those which reduce the rate of electron/hole recombination in the vicinity of the electrode interface. Any passivation layer which is known to the person skilled in the art and which he considers to be suitable in the context of the invention can be employed. Preferred passivation layers according to the invention are silicon nitride, silicon dioxide and titanium dioxide, silicon nitride being most preferred. According to the invention, it is preferred for the passivation layer to have a thickness in a range from about 0.1 nm to about 2 μm, more preferably in a range from about 10 nm to about 1 μm and most preferably in a range from about 30 nm to about 200 nm.

A single layer can serve as anti-reflection layer and passivation layer. In one embodiment of the invention, one or more layers which act as anti-reflection layer and/or passivation layer are present between the p-doped layer and the superimposed first paste in the solar cell precursor. In one aspect of this embodiment, at least one of the layers which function as anti-reflection layer and/or passivation layer comprises SiN_(x), wherein x stands for a positive but not necessarily whole number.

Additional Protective Layers

In addition to the layers described above which directly contribute to the principle function of the solar cell, further layers can be added for mechanical and chemical protection.

The cell can be encapsulated to provide chemical protection. Encapsulations are well known to the person skilled in the art and any encapsulation can be employed which is known to him and to which he considers suitable in the context of the invention. According to the invention, transparent polymers, often referred to as transparent thermoplastic resins, are preferred as the encapsulation material, if such an encapsulation is present. Preferred transparent polymers in this context are for example silicon rubber and polyethylene vinyl acetate (PVA).

A transparent glass sheet can be added to the front of the solar cell to provide mechanical protection to the front face of the cell. Transparent glass sheets are well known to the person skilled in the art and any transparent glass sheet known to him and which he considers to be suitable in the context of the invention can be employed as protection on the front face of the solar cell.

A back protecting material can be added to the back face of the solar cell to provide mechanical protection. Back protecting materials are well known to the person skilled in the art and any back protecting material which is known to the person skilled in the art and which he considers to be suitable in the context of the invention can be employed as protection on the back face of the solar cell. Preferred back protecting materials according to the invention are those having good mechanical properties and weather resistance. The preferred back protection materials according to the invention is polyethylene terephthalate with a layer of polyvinyl fluoride. It is preferred according to the invention for the back protecting material to be present underneath the encapsulation layer (in the event that both a back protection layer and encapsulation are present).

A frame material can be added to the outside of the solar cell to give mechanical support. Frame materials are well known to the person skilled in the art and any frame material known to the person skilled in the art and which he considers suitable in the context of the invention can be employed as frame material. The preferred frame material according to the invention is aluminium.

Solar Panels

A contribution to achieving at least one of the above mentioned objects is made by a module comprising at least a solar cell obtained as described above, in particular according to at least one of the above described embodiments, and at least one more solar cell. A multiplicity of to solar cells according to the invention can be arranged spatially and electrically connected to form a collective arrangement called a module. Preferred modules according to the invention can take a number of forms, preferably a rectangular surface known as a solar panel. Large varieties of ways to electrically connect solar cells as well as large varieties of ways to mechanically arrange and fix such cells to form collective arrangements are well known to the person skilled in the art and any such methods known to him and which he considers suitable in the context of the invention can be employed. Preferred methods according to the invention are those which result in a low mass to power output ratio, low volume to power output ration, and high durability. Aluminium is the preferred material for mechanical fixing of solar cells according to the invention.

DESCRIPTION OF THE DRAWINGS

The invention is now explained by means of figures which are intended for illustration only and are not to be considered as limiting the scope of the invention. In brief,

FIG. 1 shows a cross sectional view of the minimum layer configuration for a solar cell,

FIG. 2 shows a cross sectional view a common layer configuration for a solar cell,

FIGS. 3 a, 3 b and 3 c together illustrate the process of firing a front side paste,

FIG. 4 shows the positioning of cuts for the test method below to measure specific contact resistance.

FIG. 1 shows a cross sectional view of a solar cell 100 and represents the minimum required layer configuration for a solar cell according to the invention. Starting from the back face and continuing towards the front face the solar cell 100 comprises a back electrode 104, a back doped layer 106, a p-n junction boundary 102, a front doped layer 105 and a front electrode 103, wherein the front electrode penetrates into the front doped layer 105 enough to form a good electrical contact with it, but not so much as to shunt the p-n junction boundary 102. The back doped layer 106 and the front doped layer 105 together constitute a single doped Si wafer 101. In the case that 100 represents an n-type cell, the back electrode 104 is preferably a silver electrode, the back doped layer 106 is preferably Si lightly doped with P, the front doped layer 105 is preferably Si heavily doped with B and the front electrode 103 is preferably a mixed silver and aluminium electrode. In the case that 100 represents a p-type cell, the back electrode 104 is preferably a mixed silver and aluminium electrode, the back doped layer 106 is preferably Si lightly doped with B, the front doped layer 105 is preferably Si heavily doped with P and the front electrode 103 is preferably a silver and aluminium electrode. The front electrode 103 has been represented in FIG. 1 as consisting of three bodies purely to illustrate schematically the fact that the front electrode 103 does not cover the front face in its entirety. The invention does not limit the front electrode 103 to those consisting of three bodies.

FIG. 2 shows a cross sectional view of a common layer configuration for a solar cell 200 according to the invention (excluding additional layers which serve purely for chemical and mechanical protection). Starting from the back face and continuing towards the front face the solar cell 200 comprises a back electrode 104, a back passivation layer 208, a highly doped back layer 210, a back doped layer 106, a p-n junction boundary 102, a front doped layer 105, a front passivation layer 207, an anti-reflection layer 209, front electrode fingers 214 and front electrode bus bars 215, wherein the front electrode fingers penetrate through the anti-reflection layer 209 and the front passivation layer 207 and into the front doped layer 105 far enough to form a good electrical contact with the front doped layer, but not so far as to shunt the p-n junction boundary 102. In the case that 200 represents an n-type cell, the back electrode 104 is preferably a silver electrode, the highly doped back layer 210 is preferably Si heavily doped with P, the back doped layer 106 is preferably Si lightly doped with P, the front doped layer 105 is preferably Si heavily doped with B, the anti-reflection layer 209 is preferably a layer of silicon nitride and the front electrode fingers and bus bars 214 and 215 are preferably a mixture of silver and aluminium. In the case that 200 represents a p-type cell, the back electrode 104 is preferably a mixed silver and aluminium electrode, the highly doped back layer 210 is preferably Si heavily doped with B, the back doped layer 106 is preferably Si lightly doped with B, the front doped layer 105 is preferably Si heavily doped with P, the anti-reflection layer 209 is preferably a layer of silicon nitride and the front electrode fingers and bus bars 214 and 215 are preferably silver. FIG. 2 is schematic and the invention does not limit the number of front electrode fingers to three as shown. This cross sectional view is unable to effectively show the multitude of front electrode bus bars 215 arranged in parallel lines perpendicular to the front electrode fingers 214.

FIGS. 3 a, 3 b and 3 c together illustrate the process of firing a front side paste to yield a front side electrode. FIGS. 3 a, 3 b and 3 c are schematic and generalised and additional layers further to those constituting the p-n junction are considered simply as optional additional layers to without more detailed consideration.

FIG. 3 a illustrates a wafer before application of front electrode, 300 a. Starting from the back face and continuing towards the front face the wafer before application of front electrode 300 a optionally comprises additional layers on the back face 311, a back doped layer 106, a p-n junction boundary 102, a front doped layer 105 and additional layers on the front face 312. The additional layers on the back face 311 can comprise any of a back electrode, a back passivation layer, a highly doped back layer or none of the above. The additional layer on the front face 312 can comprise any of a front passivation layer, an anti-reflection layer or none of the above.

FIG. 3 b shows a wafer with electro-conductive paste applied to the front face before firing 300 b. In addition to the layers present in 300 a described above, an electro-conductive paste 313 is present on the surface of the front face.

FIG. 3 c shows a wafer with front electrode applied 300 c. In addition to the layers present in 300 a described above, a front side electrode 103 is present which penetrates from the surface of the front face through the additional front layers 312 and into the front doped layer 105 and is formed from the electro-conductive paste 313 of FIG. 3 b by firing.

In FIGS. 3 b and 3 c, the applied electro-conductive paste 313 and the front electrodes 103 are shown schematically as being present as three bodies. This is purely a schematic way of representing a non-complete coverage of the front face by the paste/electrodes and the invention does not limit the paste/electrodes to being present as three bodies.

FIG. 4 shows the positioning of cuts 421 relative to finger lines 422 in the wafer 420 for the test method below to measure specific contact resistance.

Test Methods

The following test methods are used in the invention. In absence of a test method, the ISO test method for the feature to be measured being closest to the earliest filing date of the present application applies. In absence of distinct measuring conditions, standard ambient temperature and pressure (SATP) (temperature of 298.15 K and an absolute pressure of 100 kPa) apply.

Viscosity

Viscosity measurements were performed using the Thermo Fischer Scientific Corp. “Haake Rheostress 600” equipped with a ground plate MPC60 Ti and a cone plate C 20/0.5° Ti and software “Haake RheoWin Job Manager 4.30.0”. After setting the distance zero point, a paste sample sufficient for the measurement was placed on the ground plate. The cone was moved into the measurement positions with a gap distance of 0.026 mm and excess material was removed using a spatula. The sample was equilibrated to 25° C. for three minutes and the rotational measurement started. The shear rate was increased from 0 to 20 s⁻¹ within 48 s and 50 equidistant measuring points and further increased to 150 s⁻¹ within 312 s and 156 equidistant measuring points. After a waiting time of 60 s at a shear rate of 150 s⁻¹, the shear rate was reduced from 150 s⁻¹ to 20 s⁻¹ within 312 s and 156 equidistant measuring points and further reduced to 0 within 48 s and 50 equidistant measuring points. The micro torque correction, micro stress control and mass inertia correction were activated. The viscosity is given as the measured value at a shear rate of 100 s⁻¹ of the downward shear ramp.

Specific Surface Area

BET measurements to determine the specific surface area of particles are made in accordance with DIN ISO 9277:1995. A Gemini 2360 (from Micromeritics) which works according to the SMART method (Sorption Method with Adaptive dosing Rate), is used for the measurement. As reference material Alpha Aluminum oxide CRM BAM-PM-102 available from BAM (Bundesanstalt für Materialforschung und-prüfung) is used. Filler rods are added to the reference and sample cuvettes in order to reduce the dead volume. The cuvettes are mounted on the BET apparatus. The saturation vapour pressure of nitrogen gas (N₂ 5.0) is determined. A sample is weighed into a glass cuvette in such an amount that the cuvette with the filler rods is completely filled and a minimum of dead volume is created. The sample is kept at 80° C. for 2 hours in order to dry it. After cooling the weight of the sample is recorded. The glass cuvette containing the sample is mounted on the measuring apparatus. To degas the sample, it is evacuated at a pumping speed selected so that no material is sucked into the pump. The mass of the sample after degassing is used for the calculation. The dead volume is determined using Helium gas (He 4.6). The glass cuvettes are cooled to 77 K using a liquid nitrogen bath. For the adsorptive, N₂ 5.0 with a molecular cross-sectional area of 0.162 nm² at 77 K is used for the calculation. A multi-point analysis with 5 measuring points is performed and the resulting specific surface area given in m²/g.

Specific Contact Resistance

In an air conditioned room with a temperature of 22±1° C., all equipment and materials are equilibrated before the measurement. For measuring the specific contact resistance of fired silver electrodes on the front doped layer of a silicon solar cell a “GP4-Test Pro” equipped with the “GP-4 Test 1.6.6 Pro” software package from the company GP solar GmbH is used. This device applies the 4 point measuring principle and estimates the specific contact resistance by the transfer length method (TLM). To measure the specific contact resistance, two 1 cm wide stripes of the wafer are cut perpendicular to the printed finger lines of the wafer as shown in FIG. 4. The exact width of each stripe is measured by a micrometer with a precision of 0.05 mm. The width of the fired silver fingers is measured on 3 different spots on the stripe with a digital microscope “VHX-600D” equipped with a wide-range zoom lens VH-Z100R from the company Keyence Corp. On each spot, the width is determined ten times by a 2-point measurement. The finger width value is the average of all 30 measurements. The finger width, the stripe width and the distance of the printed fingers to each other is used by the software package to calculate the specific contact resistance. The measuring current is set to 14 mA. A multi contact measuring head (part no. 04.01.0016) suitable to contact 6 neighboring finger lines is installed and brought into contact with 6 neighboring fingers. The measurement is performed on 5 spots equally distributed on each stripe. After starting the measurement, the software determines the value of the specific contact resistance (mOhm*cm²) for each spot on the stripes. The average of all ten spots is taken as the value for specific contact resistance.

Ag Particles Size Determination (d₁₀, d₅₀, d₉₀)

Particle size determination for Ag particles is performed in accordance with ISO 13317-3:2001. A Sedigraph 5100 with software Win 5100 V2.03.01 (from Micromeritics) which works according to X-ray gravitational technique is used for the measurement. A sample of about 400 to 600 mg is weighed into a 50 ml glass beaker and 40 ml of Sedisperse P11 (from Micromeritics, with a density of about 0.74 to 0.76 g/cm³ and a viscosity of about 1.25 to 1.9 mPa*s) are added as suspending liquid. A magnetic stirring bar is added to the suspension. The sample is dispersed using an ultrasonic probe Sonifer 250 (from Branson) operated at power level 2 for 8 minutes while the suspension is stirred with the stirring bar at the same time. This pre-treated sample is placed in the instrument and the measurement started. The temperature of the suspension is recorded (typical range 24° C. to 45° C.) and for calculation data of measured viscosity for the dispersing solution at this temperature are used. Using density and weight of the sample (density 10.5 g/cm³ for silver) the particle size distribution is determined and given as d₅₀, d₁₀ and d₉₀.

Dopant Level

Dopant levels are measured using secondary ion mass spectroscopy.

Efficiency, Fill Factor, Open Circuit Voltage, Contact Resistance and Series Resistance

The sample solar cell is characterized using a commercial IV-tester “cetisPV-CTL1” from Halm Elektronik GmbH. All parts of the measurement equipment as well as the solar cell to be tested were maintained at 25° C. during electrical measurement. This temperature is always measured simultaneously on the cell surface during the actual measurement by a temperature probe. The Xe Arc lamp simulates the sunlight with a known AM1.5 intensity of 1000 W/m² on the cell surface. To bring the simulator to this intensity, the lamp is flashed several times within a short period of time until it reaches a stable level monitored by the “PVCTControl 4.313.0” software of the IV-tester. The Halm IV tester uses a multi-point contact method to measure current (I) and voltage (V) to determine the cell's IV-curve. To do so, the solar cell is placed between the multi-point contact probes in such a way that the probe fingers are in contact with the bus bars of the cell. The numbers of contact probe lines are adjusted to the number of bus bars on the cell surface. All electrical values were determined directly from this curve automatically by the implemented software package. As a reference standard a calibrated solar cell from ISE Freiburg consisting of the same area dimensions, same wafer material and processed using the same front side layout is tested and the data compared to the certificated values. At least 5 wafers processed in the very same way are measured and the data interpreted by calculating the average of each value. The software PVCTControl 4.313.0 provides values to for efficiency, fill factor, short circuit current, series resistance and open circuit voltage.

Temperature Profile in the Firing Furnace

The temperature profile for the firing process was measured with a Datapaq DQ 1860 A datalogger from Datapaq Ltd., Cambridge, UK connected to a Wafer Test Assembly 1-T/C 156 mm SQ from Despatch (part no. DES-300038). The data logger is protected by a shielding box TB7250 from Datapaq Ltd., Cambridge, UK and connected to the thermocouple wires of the Wafer Test Assembly. The solar cell simulator was placed onto the belt of the firing furnace directly behind the last wafer so that the measured temperature profile of the firing process was measured accurately. The shielded data logger followed the Wafer Test assembly at a distance of about 50 cm to not affect the temperature profile stability. The data was recorded by data logger and subsequently analysed using a computer with Datapaq Insight Reflow Tracker V7.05 software from Datapaq Ltd., Cambridge, UK.

Determination of Elemental Composition Digestion Procedure:

1. Acid Digestion Procedure US EPA 3050B:

Mix the sample thoroughly to achieve homogeneity and sieve, if appropriate and necessary, using a USS #10 sieve. All equipment used for homogenization should be cleaned according to the guidance in Sec. 6.0 to minimize the potential of cross-contamination. For each digestion procedure, weigh to the nearest 0.01 g and transfer a 1-2 g sample (wet weight) or 1 g sample (dry weight) to a digestion vessel. For samples with high liquid content, a larger sample size may be used as long as digestion is completed.

For the digestion of samples for analysis by ICP-AES, add 10 mL of 1:1 HNO₃:HCl, mix the slurry, and cover with a watch glass or vapor recovery device. Heat the sample to 95° C.±5° C. and reflux for 10 to 15 minutes without boiling. Allow the sample to cool, add 5 mL of concentrated HNO₃, replace the cover, and reflux for 30 minutes. If brown fumes are generated, indicating oxidation of the sample by HNO₃, repeat this step (addition of 5 mL of conc. HNO₃) over and over until no brown fumes are given off by the sample indicating the complete reaction with HNO₃. Using a ribbed watch glass or vapor recovery system, either allows the solum tion to evaporate to approximately 5 mL without boiling or heat at 95° C.±5° C. without boiling for two hours. Maintain a covering of solution over the bottom of the vessel at all times.

After the sample has cooled, add 2 mL of water and 3 mL of 30% H₂O₂. Cover the vessel with a watch glass or vapor recovery device and return the covered vessel to the heat source for warming and to start the peroxide reaction. Care must be taken to ensure that losses do not occur due to excessively vigorous effervescence. Heat until effervescence subsides and cool the vessel.

Continue to add 30% H₂O₂ in 1-mL aliquots with warming until the effervescence is minimal or until the general sample appearance is unchanged.

Cover the sample with a ribbed watch glass or vapor recovery device and continue heating the acid-peroxide digestate until the volume has been reduced to approximately 5 mL or heat at 95° C.±5° C. without boiling for two hours. Maintain a covering of solution over the bottom of the vessel at all times.

For the analysis of samples for ICP-AES, add 10 mL conc. HCl to the sample digest and cover with a watch glass or vapor recovery device. Place the sample on/in the heating source and reflux at 95° C.±5° C. for 15 minutes.

Filter the digestate through Whatman No. 41 filter paper (or equivalent) and collect filtrate in a 100-mL volumetric flask. Make to volume and analyze by ICP-AES.

2. Microwave digestion

The digestion was performed on a commercial Microwave Digestion System using a highpressure quartz vessel (XQ80). The HF-free digestion made the quartz vessel applicable. In each digestion, an accurately weighed amount of 0.05 g coal sample was mixed with 3 ml of acid in a cleaned vessel. After the cap assembles were sealed, the four liners were stuck inside the vessel jackets and then mounted on the rotating tray in a symmetrical pattern to ensure a uniform irradiation. The heating profile was controlled by the predetermined power program. Typically, the temperature rose from room temperature to 200° C. in the first 30 min, and then to about 250° C. in the later 30 min with the autogeneous pressure of about 7.5 MPa.

After the vessel was cooled down and depressurized, the solution was carefully transferred to a to Teflon beaker. Unless stated otherwise, the solution was evaporated in an evacuated bench to a small drop of thick liquid (˜0.1 g) at a temperature below 60° C. by heating with two infrared radiation lamps. This procedure typically took 5 h. The residue was dissolved with 1 M HNO₃, and then passed through a PTFE filter with a pore size of 0.45 μm (Sterile Millex-HV Millipore), and finally diluted with 1 M HNO₃ for the instrumental analysis. Since the decomposition degree of HNO₃ upon the digestion was unknown, the evaporation procedure allowed the digestion solution to be easily adjusted on the background HNO₃ concentration and consequently, the solution could be analyzed by an external calibration method. In all experiments, the polypropylene bottles used for storing the solutions were immersed in 1 M HNO₃ overnight, and rinsed with ultrapure water, and then dried in a Class 100 bench.

Equipment and the Operating Conditions for ICP OES:

The ICP-OES analysis was performed on Optima 7300 DV ICP-OES. The operating conditions were as follows:

Inductively Coupled Plasma with Optical Emission Spectrometer Model Optima 7300 DV ICP-OES Brand Perkin Elmer Conditions Sets RF Power 1.300 kW Plasma Flow 15.0 L/min Auxiliary Flow 0.2 L/min Nebulizer Flow 0.8 L/min Sample Introduction Sample Uptake 15 s Sample Flow 1.5 mL/min Pump Rate 15 rpm Rinse Time 15 s General Settings Replicates 3

ICP-AES Analysis Procedure: Test Portion

The test portion may be directly obtained from the test sample or may be diluted from the test sample to accommodate the measurement range or to dilute the matrix. The acidity of the test portion must match the acidity of calibration solutions. Ensure that all elements are present in a non-volatile form. Volatile species must be converted to non-volatile ones e.g. sulphide oxidation by hydrogen peroxide.

Set Up of the Procedure

Adjust the instrumental parameters of the ICP-AES system in accordance with the manufacturer's manual. Use the recommended optimization solution to optimize or check the sensitivity and the stability of the system. Check the wavelength calibration as often as required by the manufacturer. Select wavelengths for measurement and for background subtraction.

Apply the calibration method as per standard procedure.

Sample Measurement

Run one or more calibration solutions and calibration blanks and determine the calibration function. Run the interference check solution(s) to establish interference correction or to check presence of interference. Run all samples including spiked samples if necessary for standard addition calibration Run a calibration blank and a calibration check solution, every 25 samples or less and at the beginning and end of the sample run. Run at least one spiked sample (original sample/digest or aqueous sample) to check recovery.

Run at least one pre digestion blank. Run at least one pre digestion sample in duplicate to check inhomogeneity. Whenever a new of usual sample matrix is encountered check:

-   -   matrix effects by running the spike sample or     -   matrix effects by running a fivefold diluted sample and     -   inter-element interference analysing at a different wavelength.

Consider a change in calibration strategy.

Calculation

Calculate the element concentration in the aqueous sample:

ρ=(ρ₁−ρ₀)f _(d) f _(a)

Calculate the element concentration in the digested solid sample:

w=(ρ₁−ρ₀)f _(a) V/m

where: ρ concentration of the element in the aqueous sample in mg/l; ρ₁ concentration of the element in the test sample in mg/l;) ρ₀ concentration of the element in the blank in mg/l; f_(d) dilution factor due to digestion of an aqueous sample; in all other cases f_(d)=1; f_(a) dilution factor of the test portion; w mass fraction of the element in the solid sample in mg/kg; V volume of the test sample (digest) in 1; m mass of the digested sample in kg.

Examples

The invention is now explained by means of examples which are intended for illustration only and are not to be considered as limiting the scope of the invention.

Paste Preparation

A paste was made by mixing, by means of a Kenwood Major Titanium mixer, the appropriate amounts of organic vehicle (Table 1), Ag powder (PV 4 from Ames Inc. with a d₅₀ of 2 μm), glass according to the specific invention (Table 2) ground to d₅₀ of 2 μm, zinc oxide (Sigma Aldrich GmbH, article number 204951). The paste was passed through a 3-roll mill Exact 80 E with stainless steel rolls with a first gap of 120 μm and a second gap of 60 μm with progressively decreasing gaps to 20 μm for the first gap and 10 μm for the second gap several times until homogeneity. The viscosity was measured as mentioned above and appropriate amounts of organic vehicle with the composition given in Table 1 were added to adjust the paste viscosity toward a target in a range from about 16 to about 20 Pas. The wt. % s of the constituents of the paste are given in Table 3.

Glass Synthesis:

The raw materials for respective oxides for the synthesis of glasses were obtained from Sigma Aldrich. These include Lead Oxide, Bismuth (III) Oxide, Tungsten (VI) Oxide, Tellurium (IV) Dioxide, Zinc Oxide, Silver Nitrate, Molybdenum (VI) Oxide, Silicon Dioxide, Titanium (IV) Oxide, Boric Acid, Lithium Carbonate etc. and others as required for the glass composition. The desired proportions of the raw materials totalling 100 gm were thoroughly mixed in an automated pestle and mortar, Model RM200 by Retsch, Germany for 5 to 10 minutes using sintered aluminium oxide mortar and pestle. This raw materials mixture was then transferred to 250 ml high purity alumina crucible. The crucible containing the raw materials mixture was heated in an electric furnace HTK 70/16 from Thermconcept, Germany with MoSi₂ heating elements at temperature ranging between 800 and 1200° C. After melting, the glass melt was soaked for 10 to 120 min Finally the glass melt was poured in a stainless steel bucket with 1 to 5 litre water. The excess water was decanted and the glass was dried at 80-90° C. to get coarse glass frits with size ranging from 0.1 mm to 10 mm

Glass Sizing

The coarse glass frits were first pre-ground in an automated pestle and mortar, Model RM200 by Retsch, Germany for 5 to 10 minutes using sintered aluminium oxide mortar and pestle. This step yielded particles ranging from 100 micron to 2 mm. The pre-ground glass was then transferred in a 250 ml sintered aluminium oxide grinding jar. To this 8 mm size YTZ grinding media in a typical ratio 1:4 to 1:12 (Actual 1:6) (glass: grinding media) was added. Mixture was milled either dry or wet (in water or organic solvent such as alcohol). This jar was placed in planetary ball mill Model PM400 by Retsch, Germany and milled at speeds ranging 30-400 min⁻¹ (Actual 100 min⁻¹). The total milling time ranged from 1 hour to 6 hours. In case of wet milling, the slurry was transferred in a glass tray and the dried by solvent evaporation at 80−90° C. The average particle size obtained by this method ranges from 0.3 micron to 10 micron.

TABLE 1 Constituents of organic vehicle Organic Vehicle Component Proportion of component 2-(2-butoxyethoxy)ethanol) [solvent] 84 ethyl cellulose (DOW Ethocel 4) [binder] 6 Thixcin ® E [thixotropic agent] 10

TABLE 2 Glass composition - elemental composition given in wt. % based on the total weight of the glass Example Mo O Te Pb Si P B 1 7 37 0 0 45 4 7 2 7 24 0 40 18 4 7 3 7 22 4 40 16 4 7 Comparative 0 39 0 0 50 4 7

TABLE 3 Paste composition Paste Ag Organic constituent particles vehicle Glass ZnO Wt. % in paste 85 9 5 1

Solar Cell Preparation and Measurements

Pastes were applied to mono-crystalline Cz-n-type Silicon wafers with a boron doped front face and phosphorous doped back face. The wafers had dimensions of 156×156 mm² and a pseudo-square shape. The wafers had an anti-reflect/passivation layer of SiN_(x) with a thickness of about 75 nm on both faces. The solar cells used were textured by alkaline etching. The example paste was screen-printed onto the p-doped face of the wafer using a semi-automatic screen printer X1 SL from Asys Group, EKRA Automatisierungssysteme set with the following screen parameters: 290 mesh, 20 μm wire thickness, 18 μm emulsion over mesh, 72 fingers, 60 μm finger opening, 3 bus bars, 1.5 mm bus bar width. A commercially available Ag paste, SOL9600A, available from Heraeus Precious Metals GmbH & Co. KG, was printed on the back n-doped face of the device using the same printer and the following screen parameters: 325 mesh, 30 μm wire thickness, 18 μm emulsion over mesh, 156 fingers, 80 μm finger opening, 3 bus bars, 1.5 mm bus bar width. The device with the printed patterns was dried for 10 minutes at 150° C. in an oven after printing each side. The substrates were then fired with the p-doped side up in a Centrotherm DO-FF 8600-300 oven for 1.5 min. For each example, firing was carried out with maximum firing temperature of 800° C. Solar cell efficiency was measured and is given in table 4.

TABLE 4 electrical properties of solar cells. Example Cell efficiency 1 ∘ 2 + 3 ++ Comparative −− Results displayed as −−: very unfavourable, −: unfavourable, ∘: moderate, +: favourable, ++: very favourable

REFERENCE LIST

-   100 Solar cell -   101 Doped Si wafer -   102 p-n junction boundary -   103 Front electrode -   104 Back electrode -   105 Front doped layer -   106 Back doped layer -   200 Solar cell -   207 Front passivation layer -   208 Back passivation layer -   209 Anti-reflection layer -   210 Highly doped back layer -   300 Wafer -   311 Additional layers on back face -   312 Additional layers on front face -   313 Electro-conductive paste -   214 Front electrode fingers -   215 Front electrode bus bars -   420 Wafer -   421 Cuts -   422 Finger lines 

1. An electro-conductive paste at least comprising as paste constituents: a) metallic particles; b) a glass; c) an organic vehicle; and d) an additive; wherein the glass comprises the following: i) Pb in the range from about 1 to about 94, ii) Mo in the range from about 2 to about 30 wt. %; iii) O in the range from about 1 to about 50 wt. %; with the wt. % in each case being based on the total weight of the glass.
 2. The paste according to claim 1, wherein the Pb is present in the glass in oxidation state in the range from +2 to +4.
 3. The paste according to claim 1, wherein the Mo is present in the glass in oxidation state in the range from +3 to +6.
 4. The paste according to claim 1, wherein the glass comprises Te.
 5. The paste according to claim 1, wherein the metallic particles are Ag particles.
 6. The paste according to claim 1, wherein the glass is present in the paste in the range from about 1 wt. % to about 6 wt. %, based on the total weight of the paste.
 7. A precursor comprising the following: a. a wafer; b. an electro-conductive paste according to claim 1 superimposed over the wafer.
 8. The precursor according to claim 7, wherein the wafer is an Si wafer.
 9. The precursor according to claim 7, wherein the wafer comprises at least one n-doped region and at least one p-doped region.
 10. The precursor according to claim 9, wherein the paste is superimposed over a p-doped region.
 11. The precursor according to claim 9, wherein the paste is superimposed over an n-doped region.
 12. The precursor according to claim 9, wherein the paste is superimposed over the front face of the wafer.
 13. The precursor according to claim 9, wherein the paste is superimposed over the back face of the wafer.
 14. A process for the preparation of a solar cell at least comprising the steps: provision of a precursor according to claim 9; firing of the precursor to obtain a solar cell.
 15. A solar cell obtainable by the process according to claim
 14. 16. A solar cell comprising the following solar cell constituents: a. A wafer; b. An electrode, wherein the electrode contains Mo in the range from about 0.01 to about 1.2 wt. %, based on the total weight of the electrode.
 17. A module comprising at least one solar cell according to claim 15 and at least a further solar cell. 